High-reliability Program Loading Method for SMJ320C6415
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Shanghai Radio Equipment Research Institute, Shanghai 201109 , China
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摘要:
针对航天产品在轨期间可擦除的磁性随机存取存储器(magnetic random access memory,MRAM)存在单粒子翻转(single-event upset,SEU)的问题,提出了一种数字信号处理器(DSP)芯片SMJ320C6415的高可靠程序加载方法。该方法采用多重冗余设计,在MRAM中备份多个DSP加载程序和用户程序,并通过三选二多数表决以剔除发生单粒子翻转的程序。试验结果表明该方法提高了DSP程序加载的可靠性和可维护性。
Abstract:
To address the single-event upset (SEU) issue in erasable magnetic random access memory (MRAM) of aerospace products during the orbital operation,a high-reliability program loading method for DSP chip SMJ320C6415 was proposed.The method employed a multiple-redundancy design that stored backup copies of both DSP loading programs and user programs in MRAM,incorporating a two-out-of-three majority voting mechanism to eliminate programs corrupted by SEU.The experimental results show that the method greatly improves the reliability and maintainability of DSP programs loading.